Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("Difractómetro rayos X")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 57

  • Page / 3
Export

Selection :

  • and

A laue diffractometer with δ geometryLANGE, J; BURZLAFF, H.Journal of applied crystallography. 1992, Vol 25, pp 440-443, issn 0021-8898, 3Article

Protection against goniostat collisions for the Huber 511 goniostat used in conjunction with the San Diego multiwire area detector systemLEIDICH, R; HAMILTON, P; BERNAL, V et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 466, 3Article

Microcomputer-based acquisition system for the Philips PW1050 powder diffractometerGRIGG, M. W; KEATING, A; BROCKWELL, A et al.Journal of applied crystallography. 1992, Vol 25, pp 652-653, issn 0021-8898, 5Article

An automatic four-circle diffractometer designed for precise lattice-parameter determinationKUCHARCZYK, D; PIETRASZKO, A; ŁUKASEWICZ, K et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 467, 3Article

Accuracy in powder diffraction II. International conferencePRINCE, E; STALICK, J. K.NIST special publication. 1992, Num 846, issn 1048-776X, 237 p.Conference Proceedings

Orientation of single crystals in an x-ray diffractometer with a two-dimensional detector and an optical displayRUBINSKII, S. V; KHEILER, D. M.Soviet physics. Crystallography. 1990, Vol 35, Num 5, pp 626-629, issn 0038-5638Article

Characterization of Pousao Pigments and Extenders by Micro-X-ray Diffractometry and Infrared and Raman MicrospectroscopyCORREIA, Andreia M; OLIVEIRA, Maria J. V; CLARK, Robin J. H et al.Analytical chemistry (Washington, DC). 2008, Vol 80, Num 5, pp 1482-1492, issn 0003-2700, 11 p.Article

Correction of measurements of intensity and coordinates in diffractometer with x-y detectorPOPOV, A. N; SUL'YANOV, S. N; KHEIKER, D. M et al.Soviet physics. Crystallography. 1992, Vol 37, Num 4, pp 456-461, issn 0038-5638Article

X-ray analysis of GaAs layers on GaAs(001) and GaAS(111)B surfaces grown at low temperatures by molecular beam epitaxyCAPANO, M. A; YEN, M. Y; EYINK, K. G et al.Applied physics letters. 1991, Vol 58, Num 17, pp 1854-1856, issn 0003-6951Article

Industrielle Röntgendiffraktometer für europäische Aluminium-Schmelzerei = Industrial X-ray diffractometers control for european aluminium smelterKEULEN, E.Metall (Berlin, West). 1992, Vol 46, Num 4, pp 329-332, issn 0026-0746Article

Analyse de matériaux céramiques grâce à un système de diffraction X des poudres équipé d'un détecteur semi-conducteur = Solid state Si detector system in X-ray powder diffraction ceramics analysisMULLER, Juliette; GIROD, Francois; MATULA, Georges et al.Spectra 2000 analyse. 2002, Vol 31, Num 226, pp 41-43, issn 1255-2909Article

X-ray analysis of coals treated with organic liquids. detailed study of the adduct formed between pyridine molecules and Beulah Zap ligniteDUBOSE, Stephen B; WERTZ, David L.Energy & fuels. 2002, Vol 16, Num 3, pp 669-675, issn 0887-0624Article

Measurement channel and principal parameters for a diffractometer for single crystals, made from CAMAC moduliSOLOV'EVA, V. I; KHEIKER, D. M; KIRSCH, S. G et al.Soviet physics. Crystallography. 1991, Vol 36, Num 4, pp 566-568, issn 0038-5638Article

Simultaneous enhancement of latent heat and thermal conductivity of docosane-based phase change material in the presence of spongy grapheneLI, J. F; LU, W; ZENG, Y. B et al.Solar energy materials and solar cells. 2014, Vol 128, pp 48-51, issn 0927-0248, 4 p.Article

Studies on improvement of hydrogen storage capacity of AB5 type:MmNi4.6Fe0.4 alloySINGH, Akanksha; SINGH, B. K; DAVIDSON, D. J et al.International journal of hydrogen energy. 2004, Vol 29, Num 11, pp 1151-1156, issn 0360-3199, 6 p.Article

The effect of additives on the crystallization of cefazolin sodium during freeze-dryingPYNE, Abira; SURYANARAYANAN, Raj.Pharmaceutical research. 2003, Vol 20, Num 2, pp 283-291, issn 0724-8741, 9 p.Article

A study on the crystal structure of palm oil-based whipping creamMAN, Y. B; SHAMSI, K; YUSOFF, M. S. A et al.Journal of the American Oil Chemists' Society. 2003, Vol 80, Num 5, pp 409-415, issn 0003-021X, 7 p.Article

An X-ray powder diffraction attachment for in situ studies of ion insertion processes in electrode materialsBERGSTRÖM, Ö; GUSTAFSSON, T; THOMAS, J. O et al.Journal of applied crystallography. 1998, Vol 31, pp 103-105, issn 0021-8898, 1Article

Behaviour of crystallised phases of Portland cement upon water attack = Evolution des phases cristallisées du ciment Portland attaqué par de l'eauFAUCON, P; ADENOT, P; JORDA, M et al.Matériaux et constructions. 1997, Vol 30, Num 202, pp 480-485, issn 0025-5432Article

A transmission geometry electrochemical cell for in situ x-ray diffractionROBINSON, K. M; O'GRADY, W. E.Review of scientific instruments. 1993, Vol 64, Num 4, pp 1061-1065, issn 0034-6748Article

X-ray diffraction examination of the fine structure of polycrystalsKOLEROV, O.K; SKRYABIN, V.G; KALYSHENKO, M.F et al.Zavodskaâ laboratoriâ. 1985, Vol 51, Num 9, pp 46-48, issn 0321-4265Article

100 mm Wide Bore Cryocooled Hybrid Magnet for a High Field X-ray DiffractometerTAKAHASHI, K; KOYAMA, K; WATANABE, K et al.IEEE transactions on applied superconductivity. 2008, Vol 18, Num 2, pp 536-539, issn 1051-8223, 4 p.Conference Paper

First application of an X-ray imaging plate system for the accurate evaluation of the crystallite modulus of polymersTASHIRO, K; NISHIMURA, H; KOBAYASHI, M et al.Macromolecular rapid communications. 1996, Vol 17, Num 9, pp 633-638, issn 1022-1336Article

CuTaN2, a copper (I)-tantalum (V)-nitride with delafossite structureZACHWIEJA, U; JACOBS, H.European journal of solid state and inorganic chemistry. 1991, Vol 28, Num 5, pp 1055-1062Article

Twinning study of CdTe epitaxic layer by X-ray φ-scan measurementBRIZARD, C; ROLLAND, G; LAUGIER, F et al.Journal of applied crystallography. 1993, Vol 26, pp 570-573, issn 0021-8898, 4Article

  • Page / 3